HIGHLIGHTS
- who: Germanicus Rosine Coq et al. from the , Caen , France have published the paper: Statistical investigations of an ENIG Nickel film morphology by Atomic Force Microscopy, in the Journal: (JOURNAL)
- what: The authors propose to consider the dynamic scale theory and the power spectrum density (PSD) analysis to perform a comprehensive determination of the surface properties of the ENIG nickel layer. The aim of this process consists in obtaining a Nickel film on interconnections pads, with a high uniformity and excellent conductivity. This analysis provides also information on the lateral roughness distribution.
- how . . .
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