HIGHLIGHTS
- who: Ciprian Florea and collaborators from the Electrotechnics and Measurements Department, Technical University of have published the paper: Test Structure Design for Defect Detection during Active Thermal Cycling, in the Journal: Sensors 2022, 22, x FOR PEER REVIEW of /2022/
- what: In this Article a test structure consisting of a lateral DMOS transistor equipped with several integrated is proposed for metallization fatigue assessment. The approach proposed in this paper consists of placing some thin metal lines in TTML between adjacent metal lines carrying different signals (i.e., source and drain signals) and routing them in . . .
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