The adhesive force measurement between single led and substrate based on atomic force microscope

HIGHLIGHTS

• who: Jie Bai and collaborators from the School of Mechanical Engineering, Tiangong University, Tianjin, China have published the research work: The Adhesive Force Measurement between Single LED and Substrate Based on Atomic Force Microscope, in the Journal: (JOURNAL)
• what: The experimental results show that the preload has a great influence on the adhesion,
• how: Separating u00b5LEDs from PDMSs creates two new interfaces and the force value Fcr required A=uf070nRuf073 2 exp( -h / uf073 ) for this process is obtained as Fcr=Au03b3 3 W=nE * R1/ 2uf073 3 / 2 exp( -h / uf073 ) 4 . . .
  

   

  

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