HIGHLIGHTS
- who: Steve S. Chung from the Department of Electrical Engineering and Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan have published the Article: The discovery of a third breakdown: phenomenon, characterization and applications, in the Journal: (JOURNAL)
- how: By taking advantage of the generation of traps at the interfacial layer (e_g Fig 5b) the authors developed further an experiment in Fig 8a from which a different breakdown was observed.
SUMMARY
This led the authors to the discovery of a third breakdown, different from soft breakdown and hard breakdown . . .
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