The quantification of southern corn leaf blight disease using deep uv fluorescence spectroscopy and autoencoder anomaly detection techniques

HIGHLIGHTS

• What: The authors demonstrate a non-destructive method to quantify the signs of fungal infection in SLB-infected corn plants using a deep UV (DUV) fluorescence spectrometer with a 248.6 nm excitation wavelength to acquire the emission spectra of healthy and SLB-infected corn leaves. The main motivation for using this instrument was its capability to operate in the DUV region using 248.6 nm excitation wavelength. As a more robust method of quantification, the authors demonstrate the use of an anomaly detection model based on an autoencoder error.
• Who: Hashem Banah and colleagues . . .
  

   

  

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