HIGHLIGHTS
- who: Xiaoming Chen and collaborators from the School of Optoelectronic Engineering and Instrumentation Science, Dalian University of Technology have published the paper: Time-Varying Pseudorandom Disturbed Pattern Generation Algorithm for Track Circuit Equipment Testing, in the Journal: Micromachines 2022, 853 of 29/05/2022
- what: In combination with the D algorithm this work proposes a new switching logic between two algorithms by counting invalid pattern proportions.
- how: In this work only the most common and effective stuck-at fault is considered which represents the situation in which one line of the circuit is . . .
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