HIGHLIGHTS
- who: XFELs et al. from the Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron DESY, Notkestrasse, Hamburg, Department of Physics, University of Hamburg, Jungiusstrasse, Hamburg, Germany* have published the article: Towards the theoretical limitations of X-ray nanocrystallography at high intensity: the validity of the effective-form-factor description, in the Journal: IUCrJ (2018). 699-705 of /2018/
- what: In Fig 3 the authors compare the goodness of fit of two different approximations using the R factor at several intensities. Next, the authors demonstrate how the scattering intensity may be approximated by a coherent . . .
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