Unravelling local environments in mixed tio2-sio2 thin films by xps and ab initio calculations

HIGHLIGHTS

• who: Pavel Ondrau010dka and colleagues from the Masaryk University des Matu00e9riaux Jean Rouxel, IMN, Nantes, France have published the article: Unravelling local environments in mixed TiO2-SiO2 thin films by XPS and ab initio calculations, in the Journal: (JOURNAL)
• what: The authors develop a more quantitative approach to the determination of the phase separation in mixed TiO2-SiO2 films. It is possible that some fluctuations are caused by uncertainty in the VBM determination, hence the authors show also the relative energy shifts between them as well as between the Ti-O-Ti O 1s component . . .
  

   

  

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