Use of electron backscatter diffraction patterns to determine the crystal lattice. part 2. offset corrections

HIGHLIGHTS

• who: Kikuchi and colleagues from the Federal Institute for Materials Research and Testing (BAM), Unter den Eichen, Berlin, Germany, bInstitut fuu0308r Materials and Nanotechnology, AGH University of Science and Technology, Mickiewicza, Krakow, Poland have published the research: Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections, in the Journal: (JOURNAL)
• what: For simulated Kikuchi patterns aCALM is systematically P too high.

SUMMARY

Since for simulated patterns the true lattice parameters are known, the offset a/a=(aCALM a0)/a0 can easily be displayed as a . . .

 



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