Very-high-frequency probes for atomic force microscopy with silicon optomechanics

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  • who: L. Schwab from the (UNIVERSITY) have published the Article: Very-high-frequency probes for atomic force microscopy with silicon optomechanics, in the Journal: (JOURNAL)
  • what: The authors propose an AFM probe technology based on silicon optomechanics to overcome this limitation. In Fig 4e, the authors demonstrate in contrast the all-optical operation of the probe resonator. This analysis shows that the operation of the probe with an amplitude less than the picometer causes the water meniscus to be in equilibrium at all times despite the oscillation frequency being >100 MHz. The aim of this . . .

     

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