HIGHLIGHTS
- who: Mareike Gerken from the Stuttgart State Academy of Art and Design and the Stu00e4del Cooperation Professorship at the Institute of the Art History at the Goethe-University FrankfurtThe analysis approach combines micro-X-ray fluorescence scanning (MA-XRF) with a novel advanced use of IRR, that uses IR-LEDs with a narrow wavelength range for illumination (LEDE-IRR). Results are compared to invasive scanning electron microscopy with energy dispersive, ray analysis (SEM/EDX) on cross-sections. This paper aims to present and evaluate possibilities and limits of MA-XRF and LEDE-IRR as a routine approach . . .
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